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Microscopic tunneling spectroscopy on high-temperature superconductorsKITAZAWA, K.Science (Washington, D.C.). 1996, Vol 271, Num 5247, pp 313-314, issn 0036-8075Article

A fully computerized scanning tunnelling microscopeCHWIALKOWSKI, M; KLUSEK, Z; KOBIERSKI, P et al.Acta physica Polonica. A. 1993, Vol 83, Num 5, pp 621-628, issn 0587-4246Conference Paper

Detection of formic acid vapor inelastic electron tunneling spectroscopy of infused Al-Al₂O₃-M-Au junctionsMAZUR, U; WANG, X. D; HIPPS, K. W et al.Analytical chemistry (Washington, DC). 1992, Vol 64, Num 17, pp 1845-1850, issn 0003-2700Article

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Rotational tunnelling after 15 years of neutron scatteringPRAGER, M.Physica. B, Condensed matter. 1991, Vol 174, Num 1-4, pp 218-226, issn 0921-4526Conference Paper

Scanning tunneling microscopy studies of polythiophene and poly-3-bromothiophene filmsPORTER, T. L; JEFFERS, S; CAPLE, G et al.Surface science. 1990, Vol 238, Num 1-3, pp L433-L438, issn 0039-6028Article

Frequency shifts in inelastic electron tunnelling spectroscopy of adsorbed speciesADKINS, C. J; SLEIGH, A. K.Journal of physics. C. Solid state physics. 1987, Vol 20, Num 27, pp 4307-4313, issn 0022-3719Article

Investigations of Pd clusters by the combined use of HREM, STM, high-energy spectroscopies and tunneling conductance measurementsAIYER, H. N; VIJAYAKRISHNAN, V; SUBBANNA, G. N et al.Surface science. 1994, Vol 313, Num 3, pp 392-398, issn 0039-6028Article

Cryogenic scanning tunneling microscopy and spectroscopy on the cleaved surface of Bi-Sr-Ca-Cu-O down to 4.2 KHASEGAWA, T; NANTOH, M; KITAZAWA, K et al.Japanese journal of applied physics. 1991, Vol 30, Num 2B, pp L276-L279, issn 0021-4922, 2Article

Metal-insulator-metal devices with carbonaceous current pathsPAGNIA, H.International journal of electronics. 1990, Vol 69, Num 1, pp 33-42, issn 0020-7217Article

Preliminary attempts toward device applications in high-T_c superconductorsTSUGE, H; TSAI, J; TAKEUCHI, I et al.NEC research & development. 1990, Num 97, pp 1-7, issn 0547-051XArticle

Problems of tunneling spectroscopy at oxide covered TiKOBUSCH, C; SCHULTZE, J. W.Electrochimica acta. 1995, Vol 40, Num 10, pp 1395-1399, issn 0013-4686Conference Paper

A new method for the study of excitons in semiconductorsDARGYS, A; ZURAUSKAS, S.Semiconductor science and technology. 1993, Vol 8, Num 4, pp 518-524, issn 0268-1242Article

Reliable and versatile scanning tunneling miroscopeKAISER, W. J; JAKLEVIC, R. C.Review of scientific instruments. 1988, Vol 59, Num 4, pp 537-540, issn 0034-6748Article

Confining surface state electrons in less than two dimensions : a spectroscopic studyGARCIA, J. M; SANCHEZ, O; SEGOVIA, P et al.Applied physics. A, Materials science & processing (Print). 1995, Vol 61, Num 6, pp 609-613, issn 0947-8396Article

Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum : a spectroscopic methodMCKINNON, A. W; WELLAND, M. E; WONG, T. M. H et al.Physical review. B, Condensed matter. 1993, Vol 48, Num 20, pp 15250-15255, issn 0163-1829Article

A tunneling instrument for angle resolved tunneling spectroscopySUZUKU, M; FUJII, T; MIYASHITA, M et al.Review of scientific instruments. 1991, Vol 62, Num 10, pp 2424-2426, issn 0034-6748Article

Examination of the interaction of 3-glycidoxypropyltrimethoxysilane with aluminium oxide by inelastic electron tunnelling spectroscopyCOMYN, J; OXLEY, D. P; PRITCHARD, R. G et al.International journal of adhesion and adhesives. 1989, Vol 9, Num 4, pp 201-204, issn 0143-7496, 4 p.Article